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CENTRAL FACILITIES |
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JEOL 6700F
Scanning Electron Microscope 1.0 nm resolution @ 15kV 2.2 nm resolution @ 1kV Magnification: 25X to 650,000X Robinson Backscatter Electron Detector Edax X-ray Micro Analysis System |
Phillips X Pert
Pro X-ray Diffraction System Phase Analysis Crystallography and Rietveld Analysis Residual Stress Analysis Refrectometry on thin layers High resolution rocking curve analysis |
Kurt J. Lesker Magnetron
Sputtering System Two 2" magnetron-sputtering guns RF and DC Power supplies Substrate preheating up to 800° C
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| PHI 610 Scanning
Auger Microprobe Surface Composition Scanning and Depth Profiling Capabilities SEM imaging |
X-ray Photoelectron
Spectrometer Surface Composition Elemental Oxidation State |
For more information on use and
availability contact: Mark Koontz - 410 516-5335 mkoontz@jhu.edu |
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