Surface Analysis Laboratory
Room 7 Maryland Hall
Department of Materials Science and Engineering
The Johns Hopkins University

Equipment (Purchased and maintained with help from RBD Instruments, Inc.)

Auger Electron Spectrometer

Surface Composition
Scanning and Depth Profiling Capabilities
SEM imaging

Surface Composition
Elemental Oxidation State

Scanning Auger Electron Spectrometer

• Scientific Principle of Auger Electron Spectroscopy
• Capabilities
• Elemental Composition of Solid Surfaces

Auger spectrum of an aluminum surface ion implanted with N₂⁺
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• Surface Mapping


Auger map of SiC surface sample imbedded with NiO particles
Left to right: secondary electron image Auger map of Nickel, Oxygen, Silicon
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• Depth Profiling

Depth profile of nickel on silicon carbide before and after annealing
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• Secondary Electron Imaging

Secondary electron image of lead nanowire
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• Technical Specifics: PHI 610 Scanning Auger Microscope

X-ray Photoelectron Spectrometer

• Elemental/Compositional Analysis of Surfaces (including Polymers)

XPS full survey of CF₃(CF₂)₇(CH₂)₂SH self-assembled monolayer adsorbed on gold
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• Surface Identification of Oxidation State and Local Environment



LEFT: XPS survey of C(1s) region for CF₃(CF₂)₇(CH₂)₂SH adsorbed on Au showing different forms of Carbon

RIGHT: XPS survey of Ta(4f) region for Ta₂O₅ showing both oxidized and metallic Ta
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