Tel: 410-516-8145
Fax: 410-516-5293
materials-at-jhu.edu



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JEOL 6700F
Scanning Electron Microscope
1.0 nm resolution @ 15kV
2.2 nm resolution @ 1kV
Magnification: 25X to 650,000X
Robinson Backscatter Electron Detector
Edax X-ray Micro Analysis System
 Phillips X Pert Pro
X-ray Diffraction System
Phase Analysis
Crystallography and Rietveld Analysis
Residual Stress Analysis
Refrectometry on thin layers
High resolution rocking curve analysis
PHI 610 Scanning Auger Microprobe
Surface Composition
Scanning and Depth Profiling Capabilities
SEM imaging




 X-ray Photoelectron Spectrometer
Surface Composition
Elemental Oxidation State
 
 
Kurt J. Lesker Magnetron
Sputtering System
Two 2" magnetron-sputtering guns
RF and DC Power supplies
Substrate preheating up to 800° C 		 

For more information on use and availability contact: Mark Koontz - 410 516-5335
mkoontz@jhu.edu 		 













Are you considering a career in Materials Science and Engineering? Click on the links below to learn more about application options within our department.


Prospective Undergraduates


Prospective Graduates


Prospective Part-Time Graduates
 
 
Department of Materials Science and Engineering

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