Surface Analysis Laboratory

X-ray Photoelectron Spectrometer

Surface Composition
Elemental Oxidation State

Auger Electron Spectrometer

Surface Composition
Scanning and Depth Profiling Capabilities
SEM imaging

For further information contact:
Mark Koontz
410-516-5335 (phone)
mkoontz@jhu.edu (e-mail)

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X-ray Photoelectron Spectrometer

 

• Scientific Principle of X-ray Photoelectron Spectroscopy
• Capabilities:

• Elemental/Compositional Analysis of Surfaces (including Polymers)

XPS full survey of CF₃(CF₂)₇(CH₂)₂SH self-assembled monolayer adsorbed on gold
Larger View
• Surface Identification of Oxidation State and Local Environment



LEFT: XPS survey of C(1s) region for CF₃(CF₂)₇(CH₂)₂SH adsorbed on Au showing different forms of Carbon

RIGHT: XPS survey of Ta(4f) region for Ta₂O₅ showing both oxidized and metallic Ta
Larger View
 
 

• Technical Specifics: 5400 XPS

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Scanning Auger Electron Spectrometer

 

• Scientific Principle of Auger Electron Spectroscopy
• Capabilities
• Elemental Composition of Solid Surfaces

Auger spectrum of an aluminum surface ion implanted with N₂⁺
Larger View
• Surface Mapping


Auger map of SiC surface sample imbedded with NiO particles
Left to right: secondary electron image Auger map of Nickel, Oxygen, Silicon
Larger View
• Depth Profiling

Depth profile of nickel on silicon carbide before and after annealing
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• Secondary Electron Imaging

Secondary electron image of lead nanowire
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• Technical Specifics: PHI 610 Scanning Auger Microscope