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| Robert C. Cammarata Professor of Materials Science and Engineering Ph.D. Applied Physics, Harvard University, 1985 M.S. Applied Physics, Harvard University, 1980 S.B. Materials Science and Engineering, Massachusetts Institute of Technology, 1979 |
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Professor Cammarata also has research programs concerning the effects of stresses on the stability and structure of thin films and surfaces. The effects of applied stresses on surface structure are being studied experimentally using low energy electron diffraction and scanning tunnelinT.M. Trimble and R.C. Cammarata, "Computer Simulation of Surface Reconstructions in (111) Oriented fcc Metal Surfaces," Mat. Res. Soc. Symp. Proc. 648, P3.22 (2001). g microscopy on single metal and semiconductor crystals subjected to bending under ultrahigh vacuum conditions. Computer simulations are being conducted to study the effects of surface and interface stresses on surface reconstructions in metals. Surface and interface stress effects on the growth of thin films and superlattices are also being modeled. |
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Selected Publication I. Shao, P.M. Vereecken, C.L. Chien, P.C. Searson, and R.C. Cammarata, "Synthesis and Characterization of Particle-Re-Inforced Ni/Al2O3 Nanocomposites," J. Mater. Res. 17, 1412 (2002). .J.A. Floro, E. Chason, R.C. Cammarata, and D.J. Srolovitz, "Physical Origins of Intrinsic Stresses in Volmer-Weber Thin Films," MRS Bulletin 27 (1), 19 (2002). I. Shao, P.M. Vereecken, R.C. Cammarata, and P.C. Searson, "Kinetics of Particle Codeposition of Nanocomposites," J. Electrochem. Soc. 149, C610 (2002). S.M. Prokes and R.C. Cammarata, "Novel Defect-Related Properties of Silicon," Defects and Diffusion Forum 200-202, 219 (2002). R.C. Cammarata and K. Sieradzki, "Thermodynamics of Thin Film Epitaxy," J. Appl. Mech. 69, 415 (2002). I. Shao, P.M. Vereecken, R.C. Cammarata, P.C. Searson, and C.L. Chien, "Electrochemical Deposition of FeCo and FeCo/TiO2 Nanocomposites," Mat. Res. Soc. Symp. Proc. 674, U5.3.1 (2001). M.R. Stoudt, R. E. Ricker, and R.C. Cammarata, "The Influence of a Multilayered Metallic Coating on Fatigue Crack Nucleation," Int. J. Fatigue 23, S215 (2001). T.M. Trimble and R.C. Cammarata, "Computer Simulation of Surface Reconstructions in (111) Oriented fcc Metal Surfaces," Mat. Res. Soc. Symp. Proc. 648, P3.22 (2001). C. Freisen, N. Dimitrov, K. Sieradzki, and R.C. Cammarata, "Surface Stress and the Electrocapillarity of Solid Electrodes," Langmuir 17, 807 (2001). R.C. Cammarata "Surface Stress Effects on the Intrinsic Stress of Thin Films," in Proceedings of the International Symposium on Adhesion Aspects of Thin Films, Volume 1, edited by K.L. Mittal (VSP, Utrecht, 2001) p. 31. R.C. Cammarata, T.M. Trimble, and D.J. Srolovitz, "Surface Stress Model for Intrinsic Stress in Thin Films," J. Mater. Res. 15, 2468 (2000). M.R. Stoudt, R.C. Cammarata, and R. E. Ricker, "Suppression of Fatigue Cracking with Nanometer-Scale Multilayered Coating," Scripta Mater. 43, 491 (2000). J.B. Vella, A.B. Mann, T.P. Weihs, C.L. Chien, and R.C. Cammarata, "Nanoindentation Study of Amorphous Metal Multilayered Thin Films," Mat. Res. Soc. Symp. Proc. 594, 25 (2000). M.R. Stoudt, R.C. Cammarata, and R. E. Ricker, "Influence of Nanometer-Scale Multilayered Thin Film on Fatigue Crack Initiation," Mat. Res. Soc. Symp. Proc. 594, 15 (2000). C.H. Shang, T.P. Weihs, R.C. Cammarata, Y. Ji. and C.L. Chien, "Anisotropy in Magnetic and Mechanical Properties of Textured Hiperco FeCo Alloys," J. Appl. Phys. 87, 6508 (2000). C.H. Shang, R.C. Cammarata, T.P. Weihs, and C.L. Chien, "Microstructure and Hall-Petch Behavior of Fe-Co-Based Hiperco Alloys," J. Mater. Res. 15, 835 (2000). |
R.C. Cammarata, K. Sieradzki, and F. Spaepen, "Simple Model for Interface Stresses with Application to Thin Film Epitaxy," J. Appl. Phys. 87, 1227 (2000). Cammarata, R.C, "Surface and Interface Stress Effects on the Growth
of Thin Films," J.Electronic Mater. 26 (1997): 966. Cammarata, R.C., "Surface and Interface Stress Effects on Interfacial
and Nanostructured Materials," Mater. Sci. Eng. A237 (1997):
180. Cammarata, R.C., and K. Sieradzki, "Simple Model for Interface Stresses
in Semicoherent Interfaces," Mat. Res. Symp. Proc. 405, 497 (1996). Oberle, R.R., and R.C. Cammarata, "Hardness of Cu-Ni Multilayered Films
as a Function of Composition Amplitude," Scripta Metall. Mater.
32 (1995): 583. |
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